An expression was derived which correlated dynamic and kinematic reflectivities, the photoelectric absorption coefficient, and the extinction distance of a crystal. This expression was combined with X-ray topographic data in order to interpret integrated reflectivity measurements of crystals whose etch-pit densities differed by 2 orders of magnitude. It was concluded that the 2 samples consisted of similarly-sized regions of crystalline perfection which were separated by boundaries with various dislocation densities.

P.D.Moran, R.J.Matyi: Journal of Applied Crystallography, 1992, 25[3], 358-65