Defects which were generated by micro-indentation were studied by means of cathodoluminescence scanning microscopy. At temperatures below 100K, localized luminescence with a peak energy at 1.48 eV was observed. A model for the dislocation distribution on (111), (110) and (100) surfaces was presented. By analyzing dislocation rosettes on these surfaces, the defect-bound luminescence could be related to Te(g) dislocations. The polarity of the glide dislocations was established by studying the depth distribution of Te(g) dislocations on (¯1¯1¯1)Te-oriented samples.

H.Uniewski, J.Schreiber, S.Hildebrandt, H.S.Leipner: Materials Science and Engineering B, 1996, 42[1-3], 284-90