Reflection X-ray topography and scanning electron microscopy, in the panchromatic cathodoluminescence mode, were used to investigate precipitate-like defects in crystals. It was found that they had dimensions which ranged from about 10 to 50, and were either triangular or hexagonal. Associated with these defects were clusters of dislocations that had been punched out in <110> directions so as to form a star-like pattern.

P.Franzosi, G.Salviati, M.Scaffardi: Journal of the Electrochemical Society, 1995, 142[9], 3185-8