An analysis of the decomposition products of 400keV electron beam irradiated undoped, Cu-doped or In-doped material demonstrated how dopant species affected secondary defect formation. The tendency to an initial formation of Cd oxides implied the occurrence of preferential anion removal, leading to accelerated oxidation.

J.Y.Loginov, P.D.Brown, C.J.Humphreys: Materials Science Forum, 1995, 196-201, 1461-6