By using a special annealing technique, a surface density gradient of dislocations and low-angle grain boundaries was produced in a wafer of Hg0.8Cd0.2Te which had been prepared by solid-state crystallization. It was found that, in going from individual dislocations to dislocation clusters, and finally to low-angle grain boundaries, the excess noise in the corresponding regions changed from a relatively low level to an increased 1/f noise via a series of bursts.

I.S.Bakshee, L.A.Karachevtseva, A.V.Lyubchenko, V.A.Petryakov, E.A.Salkov, B.I.Khizhnyak: Physica Status Solidi A, 1990, 117[1], K37-41