A model was proposed for the creation of the anti-structural defect, TeCd. This model eliminated the discrepancy between electrophysical measurements on one hand, and the crystallographic parameters deduced from density, X-ray and mass spectroscopic measurements on the other.

S.N.Maksimovskii, S.P.Kobeleva: Izvestiya Akademii Nauk SSSR – Neorganicheskie Materialy, 1986, 22[6], 922-5