The use of X-ray diffraction techniques for the study of twin microstructures, and for the particle-size analysis of (111) layers which had been grown using metalorganic chemical vapor deposition onto GaAs substrates, was demonstrated. Two types of twin were identified: lamellar and double positioning. Both comprised small particles (domains). A method was presented for the determination of the particle thickness and width, as well as the lamellar thickness. The B layers of (111) CdTe were typically characterized by a 2-dimensional growth mechanism, a smooth surface appearance, a relatively high growth rate and a lamellar twin structure. On the other hand, the (111) A-oriented layers exhibited a 3-dimensional growth mechanism, rough surfaces, a low growth rate and double-positioning twins with a preferred twin orientation with respect to the substrate.

A.Raizman, M.Oron, G.Cinader, H.Shtrikman: Journal of Applied Physics, 1990, 67[3], 1554-61