Micro-twins in epitaxial (111)Te films, grown by metalorganic chemical vapor deposition, onto (001) sapphire substrates, were detected by means of optical reflections from the as-grown surface (which was microscopically facetted) as well as by X-ray diffraction. It was found that the micro-twin content could be made very small (much lower than 1% volume fraction) by a suitable choice of the reactor operating conditions. The use of annealing, after CdTe deposition, could remove the micro-twins.

H.L.Glass, M.R.A.Woods, M.L.Buehnerkemper, D.L.Varnum, T.P.Weismuller: Journal of Crystal Growth, 1993, 128[1-4], 617-21