The morphology and structure of CdTe(111) layers, grown onto GaAs(100) by MOCVD, were studied by means of atomic force microscopy and X-ray texture analysis. The growth conditions were chosen so that mirror-like CdTe layers were obtained. Layers whose growth times varied from 10s to 2h were investigated. The X-ray texture analysis showed that CdTe layers, grown onto GaAs substrates that were heat-treated (580C, 0.5h) in a H2 atmosphere, exhibited a (111) preferential orientation and were twinned. This twinned structure of the (111)CdTe layer, which was observed as 60° rotated triangular crystallites in atomic force microscopic images, strongly affected the surface morphology.

Influence of Twinned Structure on the Morphology of CdTe(111) Layers Grown by MOCVD on GaAs(100) Substrates. I.Mora-Seró, C.Polop, C.Ocal, M.Aguiló, V.Muñoz-Sanjosé: Journal of Crystal Growth, 2003, 257[1-2], 60-8