Thin solid films of Hg1−xCdxTe on KCl substrates were obtained by pulse laser deposition. The crystal structure of the films obtained was investigated by using electron diffraction methods. The texture crystal structure of the films exhibited 2 inequivalent orientations of grains in the plane of the substrate. Electron diffraction patterns showed on the plane defects of the layers caused by {111}-twinning. Under the right conditions such defects might lead to the growth of nanostructured grains.

Defects of the Crystal Structure of Hg1−xCdxTe Thin Layer Grown by Pulsed Laser Deposition. I.O.Rudyj, I.V.Kurilo, I.S.Virt, P.Sagan, J.Zawislak, M.Kuzma: Journal of Alloys and Compounds, 2004, 371[1-2], 180-2