Transmission electron microscopy was used to investigate the deformation microstructures of synthetic stishovite specimens deformed at 14GPa and 1300C. The geometrical characteristics of numerous dislocations were characterized by dislocation contrast and stereographic analyses in order to identify the easy-slip systems of stishovite. Transmission electron microscopy permitted characterization of the slip systems: <100>{001}, <100>{010}, <100>{021}, [001]{100}, [001]{110}, [001]{210} and <110>{1¯10}. The observation of sub-grain boundaries and scalloped edge dislocations suggested that climb was activated in these specimens.

TEM Characterization of Dislocations and Slip Systems in Stishovite Deformed at 14GPa, 1300C in the Multianvil Apparatus. M.Texier, P.Cordier: Physics and Chemistry of Minerals, 2006, 33[6], 394-402