Extended X-ray absorption fine structure, Rutherford back-scattering ion channelling and particle-induced X-ray emission channelling measurements were performed in order to investigate compensation centres in Cl-doped material. The extended X-ray absorption fine structure results for Cl-doped material suggested that almost all of the Cl atoms were incorporated into substitutional Se lattice sites. This implied that the Cl atoms themselves were not responsible for the compensation centres. Particle-induced X-ray emission channelling angular profiles were measured across the <100>, <110> and <111> axes of undoped samples. By comparing the angular profiles for various X-ray yields, it was found that some of the Te atoms (about 1020/cm3) were located at tetrahedral interstitial sites. It was concluded that the difficulty of obtaining n-type material was due to the existence of interstitial Te atoms which acted as acceptors.

Compensation Centers in ZnSeTe T.Maruyama, T.Hasegawa, N.Komuro, H.Yamada, W.Ohtsuka, K.Akimoto, Y.Kitajima, K.Maeda, E.Yagi: Journal of Applied Physics, 1999, 86[11], 5993-9