The 18O tracer diffusion method was used to investigate O diffusion in reactively dc-sputtered IrO2 films. The profile measurements were done by secondary ion mass spectrometry. For the investigation of O diffusivity in the samples, temperatures ranging from 600 to 765C were used (figure 18). The O tracer diffusion in IrO2 films was found to be described by:
D (m2/s) = 2.8 x 10-6 exp[-2.73(eV)/kT]
It was also shown that the extrinsic O diffusion was strongly influenced by the film preparation conditions, which was especially important for the application of IrO2 films as O barriers.
Oxygen Tracer Diffusion in IrO2 Barrier Films. C.U.Pinnow, I.Kasko, N.Nagel, T.Mikolajick, C.Dehm, F.Jahnel, M.Seibt, U.Geyer, K.Samwer: Journal of Applied Physics, 2002, 91[3], 1707-9
Figure 18
Diffusion of 18O in IrO2
Table 106
Electrochemical Diffusion of Li in Hexagonal Bronzes
Bronze | x | D (cm2/s) |
LixWO3 | 0.48 | 1.48 x 10-8 |
LixWO3 | 1.13 | 1.07 x 10-10 |
LixK0.20WO3 | 0.01 | 4.07 x 10-8 |
LixK0.20WO3 | 0.12 | 4.07 x 10-10 |
LixK0.20WO3 | 0.19 | 3.80 x 10-10 |
LixK0.20WO3 | 0.33 | 9.12 x 10-9 |
LixK0.20WO3 | 0.49 | 1.35 x 10-10 |
LixK0.20WO3 | 0.54 | 3.24 x 10-9 |
LixK0.20WO3 | 0.61 | 2.75 x 10-10 |
LixK0.20WO3 | 0.65 | 2.82 x 10-10 |
LixK0.26WO3 | 0.13 | 3.24 x 10-9 |
LixK0.26WO3 | 0.33 | 1.35 x 10-9 |
LixNa0.20WO3 | 0.03 | 1.29 x 10-9 |
LixNa0.20WO3 | 0.07 | 2.19 x 10-11 |
LixNa0.20WO3 | 0.12 | 1.05 x 10-10 |
LixNa0.20WO3 | 0.16 | 1.51 x 10-10 |
LixNa0.20WO3 | 0.20 | 3.02 x 10-10 |
LixNa0.20WO3 | 0.24 | 6.31 x 10-10 |
LixNa0.20WO3 | 0.28 | 1.55 x 10-9 |
LixNa0.20WO3 | 0.32 | 2.00 x 10-9 |
LixNa0.30WO3 | 0.05 | 5.13 x 10-14 |
LixNa0.30WO3 | 0.10 | 1.48 x 10-12 |
LixNa0.30WO3 | 0.16 | 2.75 x 10-12 |
LixNa0.30WO3 | 0.23 | 5.89 x 10-12 |
LixNa0.30WO3 | 0.29 | 3.47 x 10-11 |
LixNa0.30WO3 | 0.34 | 5.50 x 10-11 |
LixNa0.30WO3 | 0.40 | 6.17 x 10-11 |
LixNa0.30WO3 | 0.45 | 4.68 x 10-11 |