Phase contrast images of dislocation micropipe in SiC crystal were experimentally studied at various distances from the sample using synchrotron white beam. Computer simulation of these images permitted an understanding of the peculiarities of image formation, and the diameter of the micro-pipe was measured. The phase contrast imaging of micropipes without a monochromator was explained by the absorption of X-rays in a thick (490µm) SiC crystal, effectively forming a high brilliance radiation spectrum with a pronounced maximum at 16keV.

Study of Micropipe Structure in SiC by X-ray Phase Contrast Imaging. V.G.Kohn, T.S.Argunova, J.H.Je: Applied Physics Letters, 2007, 91[17], 171901