Transmission electron microscopy analyses of the defects formed in epitaxial SrRuO3 films on SrTiO3 (001) substrates were reported. With preparing three different forms of transmission electron microscopy specimens, i.e. plan-view, cross-sectional and free-standing specimens, various transmission electron microscopy techniques were implemented with placing emphasis on the effect of misfit strain on the defect formation. With in situ transmission electron microscopy heating observations, the present transmission electron microscopy results provide insights into the formation mechanism of misfit dislocations, the occurrence of antiphase boundary ribbons near to the misfit dislocations, and the structural phase transitions of epitaxial perovskite films.

Defects in Strained Epitaxial SrRuO3 Films on SrTiO3 Substrates. S.H.Oh, J.H.Suh, C.G.Park: Materials Transactions, 2007, 48[10], 2556-62