Scandia-stabilized zirconia thin films, ~400nm thick, were deposited on sapphire substrate by a pulsed-laser deposition method. Their structural and transport properties were studied by means of X-ray diffraction and electrical conductivity measurements. The in-plane conductivities of thin films were measured and compared to that of the bulk sample. Although the decrease in ionic conductivity near phase transition temperature (550C) was still shown in the case of the 10%scandia-stabilized zirconia film, the conductivity drop was much smaller and less abrupt compared to that of bulk samples. With 1mol%Y2O3 or CeO2 doping, the conductivity curves became linear. However, the conductivity was reduced from that of the undoped 10%scandia-stabilized zirconia film.

Electrical Conductivity of Scandia-Stabilized Zirconia Thin Film. J.H.Joo, G.M.Choi: Solid State Ionics, 2008, 179[21-26], 1209-13