Electron back-scattering diffraction and transmission electron microscopy analyses of small indentations in copper single crystals exhibited only slight changes of the crystal orientation in the surroundings of the imprints. Far-reaching dislocations might be the reason for these small misorientation changes. Using electron back-scattering diffraction and transmission electron microscopic techniques, this work made an attempt to visualize the far-propagating dislocations by introducing a twin boundary in the vicinity of small indentations. Because dislocations piled up at the twin boundary produce a misorientation gradient, the otherwise far-propagating dislocations could be detected.

Where are the Geometrically Necessary Dislocations Accommodating Small Imprints? M.Rester, C.Motz, R.Pippan:  Journal of Materials Research, 2009, 24[3], 647-51