The ‘clock’ reconstruction of the Ni(100)(2 x 2)p4g–N system was measured using surface X-ray diffraction. An in-plane displacement of the surface layer Ni atoms of dxy = 0.30Å was found. This value was smaller than that measured for this system using photoelectron diffraction and surface extended X-ray absorption fine structure.

The Ni(100)(2 x 2)p4g–N Reconstruction Determined by Surface X-Ray Diffraction. E.Dudzik, A.G.Norris, R.McGrath, G.Charlton, G.Thornton, B.Murphy, T.S.Turner, D.Norman: Surface Science, 1999, 433-435, 317-21