It was recalled that the line profiling of X-ray Bragg peaks had great potential for the extraction of useful physical parameters, such as dislocation densities and ordering lengths, from work-hardened monocrystalline samples. However, there were shortcomings in the required theoretical understanding of scattering from dislocations. A mathematically rigorous theoretical framework for understanding dislocation scattering was presented here. The procedure was based upon the first principles of kinematic scattering and upon basic laws of probability theory. These results were applied to the case of parallel screw dislocations. As expected on the basis of experimental measurements, the solution to this problem was neither completely Gaussian nor Lorentzian, but was intermediate between them. Detailed computer simulations of the scattering were compared with the theoretical predictions. They matched, without involving any adjustable parameters.

X-Ray Scattering by Dislocations in Crystals - General Theory and Application to Screw Dislocations. L.E.Levine, R.Thomson: Acta Crystallographica A, 1997, 53[5], 590-602