It was recalled that, in recent X-ray moiré topographic experiments, a dislocation-like discontinuity of the moiré fringes had been found in spite of the fact that the bicrystalline Si specimens were dislocation-free. This discontinuity, although similar in appearance to the fringe discontinuity which was known as a moiré dislocation, was essentially different. It was suggested that the appearance of such pseudo-moiré dislocations was not only related to the wave-field phase, due to the moiré effect, but also to the phase of the extinction fringes. Pseudo-moiré dislocations commonly occurred in the plane-wave X-ray moiré topography of slightly strained specimens.

Pseudo Moiré Dislocations in X-Ray Diffraction Topography. J.Yoshimura: Journal of Applied Physics, 1996, 80[4], 2138-41