The surface structure of the 3 x 3 reconstruction of the 4H-SiC (00•1) surface was investigated with surface X-ray diffraction. Of the studied models, the twist model proposed by Starke et alia (1998) gave the best fit to the experimental data. The structural parameters were determined accurately.

Structure of the SiC (0001) 3 x 3 Reconstruction Studied by Surface X-Ray Diffraction. W.Voegeli, K.Akimoto, T.Aoyama, K.Sumitani, S.Nakatani, H.Tajiri, T.Takahashi, Y.Hisada, S.Mukainakano, X.Zhang, H.Sugiyama, H.Kawata: Applied Surface Science, 2006, 252[15], 5259-62