The self-consistent tight-binding method in the extended Hückel approximation was used to calculate the electronic band structure and surface dielectric function of three Sn/Si(111) reconstructed surfaces. It was shown that the anisotropy in the imaginary part of the surface dielectric function and the corresponding reflection spectra, as determined from the self-consistent wave-functions for the three surfaces, were quite different. This suggested that the technique of reflection anisotropy spectroscopy could be used to study changes in surface reconstruction with increasing Sn deposition.

The Linear Optical Response of Reconstructed Sn/Si(111) Surfaces. H.T.Anyele, T.H.Shen, C.C.Matthai: Journal of Physics - Condensed Matter, 1996, 8[23], 4139-44