Investigations were made, of Sb-induced reconstruction on a Si(113)-(3 x 2) surface, using low-energy electron diffraction and X-ray photo-electron spectroscopy. Depending upon the annealing temperature and Sb coverage, 1 x 1, 1 x 2+2x, 2 x 2 and 2 x 5 structures were observed. The 2 x 2 and 2 x 5 structures exhibited reversible phase transitions to 1 x 2 and 1 x 5 structures, respectively, at high temperatures. The relative Sb coverages of the 1 x 1 and 2 x 2 structures, formed by annealing at about 400 and 700C, were deduced from Sb 3d/Si 2p core-level X-ray photo-electron spectroscopy intensity ratios.

Low-Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of Sb-Induced Reconstruction on Si(113)3 x 2 Surface. K.S.An, C.C.Hwang, C.Y.Park, A.Kakizaki: Japanese Journal of Applied Physics, 2000, 39, 2771-4