The critical thickness condition of misfit dislocation formation in a system involving a nanowire surrounded by a co-axial film with different elastic constants was investigated. The influence of the shear modulus ratio of the film to the nanowire (cylinder), the misfit strain and the radius of nanowire on the critical thickness of the film was discussed. The results show that the critical thickness of the film for the formation of the misfit dislocations decreased monotonically with the increment of the ratio of the shear modulus. However, if the ratio of the shear modulus was reached at a certain value, the generation of misfit dislocations was energetically favorable only when the film thickness was in some range. At last, the generation of misfit dislocations was energetically unfavourable at any value of the film thickness with the ratio of the shear modulus larger than a critical value.

Misfit Dislocations in an Annular Film Grown on a Cylindrical Nanowire with Different Elastic Constants. Q.H.Fang, H.P.Song, Y.W.Liu: Physica B, 2009, 404[14-15], 1897-900