The critical thickness of a film for the formation of a misfit dislocation in the system of a strained film grown on a nanopore was studied. The influence of the

ratio of the shear modulus between the film and the substrate, the misfit strain and the radius of the nanopore on the critical thickness of the film was discussed. New phenomena concerning the critical thickness of the film were obtained due to the difference in elastic constants of the film and the substrate.

Misfit Dislocations in an Annular Strained Film Grown on a Cylindrical Nanopore Surface. Q.H.Fang, J.H.Chen, P.H.Wen, Y.W.Liu: Scripta Materialia, 2009, 60[6], 395-8