Elliptical micropipes in SiC were studied using computer simulation of the phase

contrast images. Experimental measurements of so-called white-beam images were

performed using a third-generation synchrotron radiation source. It was revealed

that transmitted X-ray spectrum of a high brilliance, with a pronounced maximum

at 16keV, permitted the formation of partially coherent images; even for

transparent objects. The computer simulation permitted the automatic

determination of the diameters of elliptical cross-sections, based upon best matches

between calculated and experimental intensity profiles. It was shown that the

micropipes studied here had extended elliptical cross-sections; sometimes rotating

around the micropipe axis.

Elliptical Micropipes in SiC Revealed by Computer Simulating Phase Contrast

Images. T.Argunova, V.Kohn, J.W.Jung, J.H.Je: Physica Status Solidi A, 2009,

206[8], 1833-7