The properties of grain boundaries within Ag-clad (Pb,Bi)2Sr2Ca2Cu3Ox (Bi-2223)

tapes were studied by means of electron back-scattering diffraction. The achieved

high image quality of the Kikuchi patterns enables multi-phase electron backscattering

diffraction scans including Bi-2223, Bi2Sr2CaCu2Ox (Bi-2212),

Bi2Sr2CuOx (Bi-2201), (Sr,Ca)14Cu24O41 and Ag to be performed. For the electron

back-scattering diffraction scans a maximum spatial resolution of 30nm was

reached enabling a detailed orientation analysis. The nature of the grain boundaries

was discussed on the base of the electron back-scattering diffraction data. While

the main orientation of the tape was in [001] direction, a large number of

misorientations was detected. These misorientations were visualized using crystal

direction maps. Furthermore, electron back-scattering diffraction permitted

spatially resolved mapping of the misorientation angles within each phase

separately. Study of Grain Boundary Properties in Ag-Clad Bi2Sr2Ca2Cu3Ox Tapes by Multi-

Phase Electron Backscatter Diffraction Analysis. A.Koblischka-Veneva,

M.R.Koblischka: Journal of Physics - Conference Series, 2008, 94[1], 012011