Samples cut out from different regions of SrLaGaO4 single crystal grown along the

[001] direction were studied with a number of X-ray diffraction topographic

methods exploring both conventional and synchrotron X-ray sources. The

synchrotron investigation included in particular white beam projection transmission

topography at ultra short wavelength and taking monochromatic beam topographs

at different points of the rocking curves at different azimuths. The methods enabled

the evaluation of the character of lattice deformation connected with the

characteristic rod-like defects observed in the core region of the crystal. A

shrinkage of the material inside the defects was indicated.

Synchrotron Topographic Studies of Growth Defects in the Core of a SrLaGaO4

Single Crystal. A.Malinowska, M.Lefeld-Sosnowska, K.Wieteska,

W.Wierzchowski, J.Härtwig, W.Graeff: Physica Status Solidi A, 2009, 206[8],

1816-9