Secondary ion mass spectrometry was employed to investigate diffusion of 2H

implanted in hydrothermally grown single crystal ZnO. Diffusion profiles were

studied after 0.5h isochronal heat treatments at 100 to 400C and evaluated using

three different models: the infinite source model, a solid solubility limited model,

and a trap limited model. Only the latter one reproduces closely the measured

values. From this model an activation energy Ea = 0.85eV was extracted, and it was

speculated that trapping may be a source of the discrepancies between the reported

values of Ea in the literature.

Deuterium Diffusion and Trapping in Hydrothermally Grown Single Crystalline

ZnO. K.M.Johansen, J.S.Christensen, E.V.Monakhov, A.Y.Kuznetsov,

B.G.Svensson: Applied Physics Letters, 2008, 93[15], 152109