The effects of ionizing radiation upon various chromium-doped silicate glasses

were studied by using EPR and Raman spectroscopy. First observed were reduction

processes of Cr3+ and Cr6+ ions that were correlated with the integrated dose inside

the glass. EPR spectroscopy indicated a complete blocking of defect production,

under ionizing radiation, for samples that were doped with more than 1mol%Cr2O3.

This was explained in terms of dynamic reversible trapping of the excitons

produced during irradiation. Associated with the disappearance of defects produced

by irradiation, there was a decrease in the glass structural changes; as detected by

Raman spectroscopy at integrated doses higher than 109Gy.

Blocking of Alkaline Migration Under Ionizing Irradiation in Cr-Doped Oxide

Glasses. B.Boizot, F.Y.Olivier, G.Petite, D.Ghaleb: Nuclear Instruments and

Methods in Physics Research B, 2008, 266[12-13], 2966-70