Samples of general formula CsAg2−xMxI3, x=0–0.4 and M=Cu and Tl, were

prepared and studied by powder X-ray diffraction, DSC and electrical conductivity

measurements. X-ray diffractograms and DSC curves showed the possibility of

stabilizing the high-temperature α-phase at lower temperatures in Tl-substituted

samples, while such results were not obtained in Cu-substituted samples. Ionic

conductivity measurements showed two regions corresponding to the low- and

high-temperature phases. The transition temperature between the two phases was

found to remain unchanged with the addition of Cu+ and decreased gradually with

increasing Tl+. The ionic conductivity decreased in Cu-substituted samples and

enhanced with the incorporation of Tl+ ion in the lattice of CsAg2I3. Dielectric

constant was found to exhibit behaviour similar to that of the ionic conductivity,

and this was an evidence of the predominant effect of ion hopping on this property.

Ionic Conductivity and Phase Stabilization in Cu- and Tl-Substituted CsAg2I3.

M.Hassan, Rafiuddin: Physica B, 2008, 403[12], 2097-102