The track damage created in LiF crystals by swift U, Xe and Kr ions with a specific

energy of 11.1MeV/u was studied using dislocation mobility measurements, track

etching, SEM, AFM and optical microscopy. The results demonstrated high

sensitivity of dislocation mobility to track core damage. The relationship between

the energy loss of ions, dislocation mobility and track structure was discussed.

Dislocation Mobility Study of Heavy Ion Induced Track Damage in LiF Crystals.

I.Manika, J.Maniks, M.Toulemonde, K.Schwartz: Nuclear Instruments and

Methods in Physics Research B, 2009, 267[6], 949-52