Thin films of Cd1−xMnxTe were fabricated via the thermal interdiffusion of MnTe/CdTe bilayers and Mn/Cd/Te trilayers. The effect of the number of repeat layers upon the interdiffusion profile was investigated using Rutherford back-scattering spectrometry. A working number of layer repetitions was found for the multilayer structure required to produce Cd1−xMnxTe. Hall measurements of the multilayers supported the Rutherford back-scattering spectrometry data.

RBS Spectrometric Studies on the Interdiffusion Profile of Multilayer Thin Film Structure to Yield Cd1−xMnxTe Alloy. P.Banerjee, B.Ghosh: Journal of Alloys and Compounds, 2009, 484[1-2], 712-7