The microstructures of ferroelectric Cd1−xZnxTe thin films, with x ≈ 0.04, grown by molecular beam epitaxy were studied using cross-sectional high-resolution transmission electron microscopy. High-density {111} lamellar twins were found to be the predominant defects in the films. Double-position twins with twin boundaries nearly parallel to (11¯2) were always observed to co-exist with (111) lamellar twins and to stop the penetration of the latter. The coexistence of the two kinds of twins produced complex twin structures with triple-point and quadruple-point junctions. The fact that lamellar (111) twins in the ferroelectric Cd1−xZnxTe layer were shorter than those in Cd1−xMgxTe buffer layers was explained. The films had uniform texture directions oriented along [111], except for a few regions with the habit faces of the twins oblique to the surface of the films.

HREM Studies of Twins in Cd1−xZnxTe (x ≈ 0.04) Thin Films Grown by Molecular Beam Epitaxy. Z.B.He, I.Stolitchnov, N.Setter, M.Cantoni, T.Wojciechowski, G.Karczewski: Journal of Alloys and Compounds, 2009, 484[1-2], 757-62