By using cross-sectional scanning tunnelling microscopy, a correlation between the surface morphology and the corresponding electronic states of the dislocations terminated at the GaN(1¯1•0) cleavage surfaces grown by molecular-beam epitaxy was demonstrated. Both scanning tunnelling spectroscopy and analysis of the dislocations on electronic structures suggested that regions surrounding dislocations register gap states in the fundamental band gap of GaN. Closely examining the recognition of the electronic structure revealed that the defect levels could provide the possibility of yellow luminescence, involving a transition from the conduction-band edge to a level at 1.2eV above the valence band edge.

Scanning Tunneling Microscopy and Spectroscopy of the Electronic Structure of Dislocations in GaN/Si(111) Grown by Molecular-Beam Epitaxy. Y.P.Chiu, B.C.Chen, B.C.Huang, M.C.Shih, L.W.Tu: Applied Physics Letters, 2010, 96[8], 082107