Computer simulations were made of powder X-ray diffraction patterns from hexagonal close-packed crystals which contained random distributions of I1-, I2- and E-type stacking faults. Of particular interest were large concentrations of stacking faults of only one orientation. The present results were compared with earlier results for random stacking faults having 2 possible orientations. An effect of the arrangement of stacking faults (1 or 2 orientations) upon the diffraction peak profiles was noted. It was shown that the observed regularities could be used to determine the predominate stacking-fault type and to establish the presence or absence of an orientational correlation between stacking faults.

Full-Profile Analysis of X-Ray Powder Diffraction Pattern of HCP Crystal with Stacking Faults. L.O.Olikhovska: Materials Science Forum, 2000, 321-324, 103-8