Kinetic and topological phenomena during 2-dimensional grain growth were studied by means of computer simulations which were based upon an atomic jump model for the migration of straight grain boundaries. The kinetics obeyed a ½-power growth law for the average grain size, and the distributions of size and numbers of sides were time-invariant. The simulated side-number distribution was entirely consistent with theoretical predictions. The simulation obeyed the Aboav-Weaire law for entire topological classes, the Lewis law for intermediate topological classes and the von Neumann-Mullins law for intermediate and high classes. A deviation from the last law, for low topological classes, was reduced by taking account of the effects of curved grain boundaries.

Two-Dimensional Simulation of Grain Growth Based on an Atomic Jump Model for Grain Boundary Migration. B.N.Kim: Materials Science and Engineering A, 2000, 283[1-2], 164-71