Monocrystalline wafers of n-type material were diffused with Yb from a layer source by annealing (1220 to 1370K, 1 to 5h). The resultant concentration profiles were determined by means of neutron activation analysis. It was found that the data could be described by:

D(cm2/s) = 2.8 x 10-5 exp[-0.95(eV)/kT]

M.K.Bakhadyrkhanov, F.M.Talipov, N.V.Sultanova, U.S.Dzhurabekov, S.S.Shasaidov, A.S.Lyutovich, A.A.Kasymov: Izvestiya Akademii Nauk SSSR - Neorganicheskie Materialy, 1990, 26[3], 458-61 (Inorganic Materials, 1990, 26[3], 385-8)