Diffusion-induced recrystallization was a mechanism which destabilizes thin film multilayers. New grains formed were distinguished by preferred composition levels characteristic for the diffusion couple. By evaluating these concentrations for different material combinations, it was demonstrated that a break of coherency by spontaneous relaxation was the key to understanding the diffusion-induced recrystallization process. Based on this, a thermoelastic model was derived to predict whether diffusion-induced recrystallization process could be expected for a given multilayer and to calculate the characteristic concentration levels.

The Hidden Link between Diffusion-Induced Recrystallization and Ideal Strength of Metals. G.Schmitz, D.Baither, M.Kasprzak, T.H.Kim, B.Kruse: Scripta Materialia, 2010, 63[5], 484-7