Molecular dynamics simulations of thin-film buckling were reported which showed that, during the buckling, dislocations could be emitted from specific region of the film where the heterogeneous stress was found to be maximum and larger than in the planar adherent part. A scenario of formation of misfit dislocations in the planar interface which lead to stress relaxation was finally proposed.

A Stress Relaxation Mechanism through Buckling-Induced Dislocations in Thin Films. J.Durinck, C.Coupeau, J.Colin, J.Grilhé: Journal of Applied Physics, 2010, 108[2], 026104