Coherent diffraction imaging on Bragg reflections was a promising technique for the study of three-dimensional composition and strain fields in nanostructures, which could be recovered directly from the coherent diffraction data recorded on single objects. The results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100nm were reported here; for which coherent diffraction imaging was used to retrieve information concerning the deformation and faults existing in these wires. Also considered was the influence of stacking faults, which could create artefacts during the reconstruction of the nanowire shape and deformation.

Analysis of Strain and Stacking Faults in Single Nanowires using Bragg Coherent Diffraction Imaging. V.Favre-Nicolin, F.Mastropietro, J.Eymery, D.Camacho, Y.M.Niquet, B.M.Borg, M.E.Messing, L.E.Wernersson, R.E.Algra, E.P.A.M.Bakkers, T.H.Metzger, R.Harder, I.K.Robinson: New Journal of Physics, 2010, 12[3], 035013