A study was made of Hg0.785Cd0.215Te and Hg0.71Cd0.29Te. A layer of In was evaporated onto the surface, and diffused in vacuum. The diffusion profiles were determined by using van der Pauw measurements and serial sectioning. The diffusivities in both compositions were essentially the same and could be described by:

D (μm2/s) = 5.25 x 102 exp[-0.38(eV)/kT]

S.Margalit, Y.Nemirovsky: Journal of the Electrochemical Society, 1980, 127[6], 1406-8