Near-surface diffusion in single crystals and thin amorphous films was studied by means of charged-particle Rutherford back-scattering and ion microprobe techniques at 200 to 450C. It was found that the latter results (figure 7) could be described by:

D (cm2/s) = 1 x 10-10 exp[-0.5(eV)/kT]

Heavy-Element Diffusion in CdTe. M.Hage-Ali, I.V.Mitchell, J.J.Grob, P.Siffert: Thin Solid Films, 1973, 19[2], 409-18