Diffusion profiles were determined by using heavy-ion (40MeV O5+) back-scattering methods. These indicated that the concentration of Hg atoms at the surface reached 4 x 1020/cm3, and that the distribution could be explained in terms of a simple diffusion model. It was shown that the data could be described by:
D (cm2/s) = 5 x 103 exp[-2.0(eV)/kT]
K.Takita, K.Murakami, H.Otake, K.Masuda, S.Seki, H.Kudo: Applied Physics Letters, 1984, 44[10], 996-8
Table 6
Arrhenius Parameters for Hg Diffusion in CdTe
Do (cm2/s) | E(eV) | Component |
3.4 x 10-11 | 0.60 | below 275C |
3.5 x 10-4 | 1.46 | above 275C |
1.0 x 10-11 | 0.36 | below 275C |
3.4 x 10-7 | 0.97 | above 275C |
Figure 13
Diffusivity of Na in p-type CdTe
hole concentration = 1011 to 8 x 1011/cm3