Etching, and radioactive tracer analysis of the remaining specimen, were used to measure the diffusivity. The latter coefficients could be varied, by a factor of up to 1000, by varying the partial pressures of the components in the ambient. At 800C, and a Se mole fraction of 10-6, the Se diffusivity could be described by:

D/pCd (cm2/s-atm.) = 5.2 x 10-14

Diffusion of Chalcogens in the II-VI Compounds. H.H.Woodbury, R.B.Hall: Physical Review, 1967, 157[3], 641-55