Etching, and radioactive tracer analysis of the remaining specimen, were used to measure the diffusivity. The latter coefficients could be varied, by a factor of up to 1000, by varying the partial pressures of the components in the ambient. At 800C, the Te diffusivity could be described by:

D/pTe (cm2/s-atm.) = 1.6 x 10-14

At 800C, the diffusivities which corresponded to the minimum total pressure and saturated Te pressure were 2.4 x 10-12 and 6.6 10-11cm2/s, respectively.

Diffusion of Chalcogens in the II-VI Compounds. H.H.Woodbury, R.B.Hall: Physical Review, 1967, 157[3], 641-55