The sheet resistance of interdiffused thin-film couples was related to the concentration profile in the sample. An analysis of the data, for temperatures of 75 to 230C, led to a relationship of the form:

D (cm2/s) = 1 x 10-9 exp[-0.48(eV)/kT]

E.N.Mgbenu: Physica Status Solidi A, 1979, 53[1], 397-401