Tracer techniques were used to study Tl diffusion in Pb0.8Sn0.2Te. It was found that fast and slow components were involved and that the data could be described by:

D(cm2/s) = 1.23 x 10-10exp[-0.33(eV)/kT]

and

D(cm2/s) = 3.8 x 10-8exp[-0.33(eV)/kT]

between 670 and 1020C for the slow and fast components, respectively.

G.P.Simirskaya, L.P.Firsova: Inorganic Materials, 1985, 21[9], 1287-9