It was noted that spatial distribution maps of various forms had previously been used to identify and characterize crystallographic structure within APT reconstructions. Most importantly, it had been shown that such spatial distribution map analyses could also provide the crystallographic orientation of the specimen with respect to the direction of the detector in the original experiment. An investigation was made here of the application of spatial distribution maps to the analysis of APT reconstruction of a nanocrystalline Al film. It was demonstrated that significant intra-granular crystallographic information was retained in the reconstruction, even in the x-y plane perpendicular to the direction of the detector. Further, the crystallographic orientation of the grains could be characterized highly accurately not only with respect to the bulk specimen but also their misorientation with respect to neighbouring grains.

Atom Probe Crystallography: Characterization of Grain Boundary Orientation Relationships in Nanocrystalline Aluminium. M.P.Moody, F.Tang, B.Gault, S.P.Ringer, J.M.Cairney: Ultramicroscopy. 2011, 111[6], 493-9