Samples which had been ion-irradiated at 100 to 773K were characterized by performing Doppler broadening measurements with slow positron beams to investigate depth profiles of irradiation-induced defects. The obtained results were compared with defect profiles calculated by Monte-Carlo simulation. Defect profiles obtained by positron measurements were always deeper than those predicted by the simulation. The difference between measured and simulated profiles was observed even in the case of the Fe sample irradiated at 100K where vacancies were immobile. The origin of such differences was considered with respect to vacancy diffusion, depth calculations, surface contamination and ion channelling.

Defect Profiles in Ion-Irradiated Metal Samples by Slow Positron Beams in Comparison with Simulation Profiles. A.Kinomura, R.Suzuki, T.Ohdaira, N.Oshima, K.Ito, Y.Kobayashi, T.Iwai: Journal of Physics - Conference Series, 2011, 262[1], 012029